V2013.07.16 - Fixed error when displaying large numbers of values in TableView. V2013.06.17 - Fixed report handling of multiple tests in Histo and Trend View report generation. - Fixed mean/median rounding issue in Scatter View display. V2013.04.04 - Added ability to select multiple tests in Histo and Trend View. Hold the shift or control keys to select multiple tests. - Changed color scheme for TestSets and Multi-test displays. Each test is now given a different color. - Added right-click menu in Histo and Trend View test list box. The menu will allow for creation of a new TestSet when multiple tests are selected. - Added right-click menu in Table View, Test view for adding and removing tests from TestSets - Fixed bug related to removal of a record from a DataSet. This functionality now works as expected. V2013.02.07 - Corrected popup error focus while processing data. The popup window did not receive the user's focus during any type of processing, making it difficult to dismiss the error. - Corrected handling of infinity values. Some instances caused issues database integrity V2013.01.30 - Added 'Select Retests' button to Record View. This will select records in the 'Test Record Viewer' pane that have duplicate Device ID's. All duplicate Device ID's except the last will be selected. This is meant to assist with isolating retested devices per file. V2013.01.02 - Added Gage R&R capability - Added Scatter View page - Added Compare Test functionality - Changed Process View operation, added more selections for processing - Changed input screen for selecting parameters for DataSet comparison. - Added the ability to highlight values above/below a threshold in Record Compare. - Added the ability to analyze all tests per DataSet - Changed some viewing aspects in TrendView for clarity. Moved the mean and median values to the right side of the graph. - Fixed sticky tag issue; Histo, Trend, Scatter, and Bin sticky info tags were not getting saved in images or reports V2012.11.07 - Added ability to view TestSets in TrendView. - Added CSV input file capability. Test numbers, names, units, and limits can be optionally specified. The values for a test are expected to be in columns. The keywords #TESTNAME, #TESTNUM, #UNITS, #LOWLIM, #HILIM can be used to identify test information for each column. The following csv example contains 4 tests, each test runs 7 times: #TESTNAME,test1,test2,test3,test4 #TESTNUM,1,2,3,4 #UNITS,A,V,A,V #LOWLIM,0.1,1,0.1,1 #HILIM,0.5,2,0.5,2 ,,,,, ,0.2,1.5,0.4,1.6 ,0.2,1.5,0.4,1.6 ,0.18,1.35,0.36,1.44 ,0.16,1.2,0.32,1.28 ,0.14,1.05,0.28,1.12 ,0.12,0.9,0.24,,0.96 ,0.2,1.5,0.4,,1.6 V2012.09.13 - Added ablility to save outlier, view and new spec limits to session files. - Corrected minor bugs in outlier and view limit operation. V2012.08.28 - Created new functionality for generating equation-based Spec limits, Outlier Limits, and View Limits. These columns can now be found and edited in Table View, under the Tests View selector. - Added ability to apply outlier limits to histograms and trend charts. - Several processing improvements were made to minimize memory usage when generating large tables of data. V2012.08.10 - Ability to open Gzipped files included in this release. Additionally, approximately 20% improvement in speed of opening data files V2012.07.27 - Corrected issue with removal of retested records and bin percentage calculations. The total number of records found were being used even when 'Remove Retested Records' was selected. V2012.07.23 - Corrected issue with zero test number. Previously a zero test number was considered invalid; this functionality was changed so that a zero test number is considered valid. V2012.07.08 - Added ability to do and independent t-test and a paired t-test. This functionality was added to the Compare button in Table View. - Added ability to change the device IDs for each record. User can select a the device ID to be set to the wafer ID and XY coordinates (in the case of wafer probe), the device serial number, a test value, or manually edit the values. V2012.06.05 - Changed Compare functionality in Table View. You can now select a subset of tests for comparison and select the DataSets to compare. Each comparison is done and displayed in the Table View. The user can the select a comparison and jump to either Trend View or Histo View. - Corrected issue with removing retested dice at probe. Retested dice can now be eliminated from the analysis. - Corrected color issue with the first DataSet created. This was inheriting the same color as the "All Records" DataSet. - Corrected issue with the changing names of File DataSets. All tests were not being updated after changing the DataSet name. - Fixed issue with multiple displays. Menus and popup windows would appear on first monitor if main DataView screen existed on second monitor. V2012.05.25 - Added new columns to statistics view in Table View. The number of fails and the failing percentage columns were added. The total number of runs was moved before these columns. - Fixed issue with last row not showing up in values view in Table View. - Added Value Range to Bin View, Test Value view. In addition to the sigma numbers the actual test value range is listed in the Bin List window - Added Mean, Standard Deviation, and units to Bin View, Test Value view. - Created 'Overlay Session' menu option under File. This option is used when the display items, include/exclude tests from one session are needed on another set of files. The new files can be opened, then the session file of interest can be 'overlaid' on the existing files. This allows all display items, excluded and included test values, etc to be applied to an open set of files. - Created new set of popup menus for Table View, Statistics view that allows for values in the table to be selected as the new test limits. All columns beyond Cpk can be selected for replacment of limits. For example, the values in the '-3 Sigma' column can be selected and made to be the lower limit for the tests selected. - Added ability to change the name of the file DataSets in Record View. Select the file in the File Selection pane and right-click. You must have create File DataSets selected for these DataSets to show up in other views. V2012.05.08 - Corrected a error with multiple-parametric-records (MPRs). MPRs that contain only one result caused the data base parser to hang. - Changed Parametric Wafer map to show only tests that are included. - Made Parametric Wafer map show positive and negative standard deviation instead of absolute value. V2012.05.07 - Added the ability to generate a spreadsheet representation of the bin totals in Bin View. A check box was added in the Bin List pane to generate this sheet. - Added a new type selection in Bin View. The 'Test Values' selection will create a bin pareto and wafer map based on the values of a test. Colors are used to indicate the distance from the mean, in terms of standard deviation. - Added TSMC WAT data reader. - Found issue with adding records to an existing DataSet. Adding records to an existing DataSet was resulting in the removal (deletion) of the records that were existing in the DataSet. - Resolved issue with custom DataSet creation related to excluded devices. Previously if an excluded device was selected for addition to a DataSet then the values for that device were included in that DataSet. The functionality has been changed so that an excluded device is always excluded from a DataSet. - Fixed issue with functional test counts when records have been excluded. Previously all records were included in all functional test calculations in Table View, Statistics view. - Corrected double-click on a bin functionality in Bin View. The operation now changes to the Record View page and displays the records found in the bin of interest. - Changed the way wafer maps are represented in DataSets and bin maps. Previously the wafer id was used in the name generation; now the wafer id is displayed. - Fixed issue with Trend View and merge files. Merging another file or more caused the record count to be incorrect in Trend View. - Fixed size issue when generating images. In some cases, the image size in the saved file was smaller than the image, resulting is some of the image being lost. V2012.03.07 - Corrected view settings for TestSets in HistoView. Some custom scaling resulted in display elements appearing off scale. - Initialize BinView to pareto, prevents getting stuck in wafer view on non wafer data files. V2012.02.22 - Added TestSet capability. Tests can be grouped in the Table View, Tests view. These tests can then be viewed in the HistoView pane. - Changed CDF so that the curve stops at the end of the data, instead of continuing until the end of the view (Histo View) - Added Include and Exclude amounts to the Process View, processing info tab. V2012.02.02 - Added the ability to save and open sessions. A session file contains all the settings and files that are in use and can be opened later to restore the conditions of DataView. - Consolidated all the individual property setting windows into a single property window, accessible from the Edit menu. Created a new properties window for controlling datasets. - Added CDF curves to the HistoView display. This item can be enabled through the properties window or by right-clicking in the HistoView window and selecting 'Show CDF Curve'. - Changed operation of DataView when first opened. User now has the option to select Analysis elements before loading files. Added a splash screen while loading configuration items. - Added ability to change the Cpk Threshold used for identifying potential test issues. This property can be selected in the Properties menu. This will also highlight low Cpk values (below set threshold) in the Statistics view page when 'Highlight fails' is selected. - Added two new columns to the Statistics view page containing the Tukey suggested lower and upper limits. V2012.01.16 - Added hyperlinks to HistoView and TrendView pages that allow for quick selection of the records in their views. The links traverse to the RecordView and TableView pages and displays the records selected in the source view. - Added the ability to have more than one user defined DataSet. - Changed the text alignment in TableView, Values display. The text is now aligned to the left for all test record values. V2012.01.12 - Added Arrange functionality for the Histo, Trend, and Bin Views. This allows users to tile dataset images. - Added a compare menu option to the Analysis menu. V2012.01.09 - Removed start analysis button from the main window. The functionality for this button is now only used in the 'Table View' statistics page. - Added a new menu when using Trend, Histo, and Bin views to allow the selection(s) of datasets. In addition, the new menu provides for users to specify the color of all datasets. - Added the ability to stop processing of 'Open Files', 'Analyze All Stats', generation of reports, and viewing of all records in 'Table View'. A popup window provides the means of stopping the appropriate activity. V2012.01.03 - Added Trendview tab allowing the users to view test record results in a sequential and graphical format. - Added support for zooming in both the Histogram and Trendview tabs. - Added feature to all an 'Exclude this Record' to the right-click menu of trend view, also an add popup that asks to reanalyze test, all open, all. V2011.12.07 - Added support for floating license mode. - Reworked backend database to allow files of any size imported into DV.