DataView is a low‐cost test data analysis tool that is used by test and product engineers to perform characterization of integrated circuit devices. DataView reads in industry standard STDF or ATDF files and can produce reports, histograms, and wafer maps in multiple formats including Excel. DataView is ideal for the test or product engineer who needs a fast and simple tool to analyze characterization data.

You can download DataView and try it out in “demo” mode, or contact us to purchase a license for full capability.

DataView Features

Multiple input data files in STDF or ATDF format

Merge data files

Processing information includes warnings for:

  • Duplicate test numbers
  • Tests with no limits
  • Tests with zero standard deviation
  • Tests with Cpk below adjustable threshold

Save reports in XLS or CSV format

Save images as GIF, JPG, EPS, or PNG format

Store images in XLS report files

Reports generated that include:

  • Test number
  • Test name
  • Mean
  • Standard deviation
  • Median
  • Min, Max (range)
  • Limits
  • Units
  • Cp, Cpk (failing Cpk highlighted)
  • +/- 3 Sigma, +/- 6 Sigma

Histograms

  • Selectable sites (all, composite, or individual)
  • Adjustable scale (values, limits, or std dev)
  • Adjustable bins

Wafer Maps

  • Selectable bin types
  • Mark retested dice option

Property fields include:

  • Index by test number, name, or both
  • Test name filters
  • Histogram display bounds
  • Histogram bins
  • Normal curve display
  • Test value reporting option
  • Good/bad Cpk threshold
  • Selectable image size