Test Spectrum was incorporated in 1999 with one goal in mind. To provide the semiconductor industry with cutting edge technical solutions in test development applications. Our team is considered the best and the brightest test development engineers serving the semiconductor industry today with over 200 years of combined test experience. Our founders saw an opportunity within the semiconductor industry for improvement; from this opportunity we have created world class solutions for world class customers. This convergence of excellence is Test Spectrum.
Todd Turner - President
Todd began his career at Motorola in 1989 after receiving his Bachelor's degree in Engineering with an electrical option from Baylor University. He spent several years performing test floor support, test hardware and software debug, ATE installation and offshore transfers, test software development, and test optimization. Todd then assumed responsibilities as the test engineering manager for a mixed-signal production test floor. He managed multiple test software development and optimization projects, process improvement programs and CIM development efforts. Todd later became a product engineering manager for xDSL and analog modem products, leading a team of both product and test engineers. His responsibilities included development and execution of new product introduction plans, product cost estimates, device specifications, and cost reductions.
Brian Page - Chief Technical Officer
Brian entered the Semiconductor industry in 1976 with an ASET degree from DeVry Institute of Technology, Dallas. His career began with repairing, constructing and debugging automatic test equipment (ATE). After entering the test software development field, his employment focused on semiconductor start-up companies including VLSI Technology, Sierra Semiconductor, Applied Micro Circuits Corporation and Universal Gate Array Corporation. He has taken on a broad range of responsibilities, including facilitating test floors, selecting (and maintaining) ATE, developing test programs and pattern conversion software. He has experience in general automation, Automatic Test Program Generators (ATPG), Test Program Release Management Systems, and other test related software productivity enhancement applications. His skills at project estimation, planning and tracking in various management functions have been key in successful project completion.
Keith Remlinger - VP Digital Test Operations
After finishing his Bachelor's degree in Engineering (electrical option) from Baylor University in 1995, Keith began working for Motorola as a test software engineer. Keith provided software engineering support, such as tester conversions, test time reduction, and operating system conversions for several different product groups within Motorola. In addition to manufacturing support, Keith designed and developed software projects for productivity enhancements through the use of statistical analysis. Later, Keith joined a product group in Motorola as a test software developer for analog modem integrated circuits. He developed and maintained probe, final test, and characterization test software for both mixed signal and high-end digital devices. Keith continued working for Motorola while he attended the University of Texas and acquired his Master's degree in Engineering (software option) in 1998. His primary areas of research at UT related to simulation-to-test vector conversion issues and test data analysis utilities.
Paul Salazar - VP Application Development
Paul's career began in 1987 working as a Telecommunications Engineer for MCI Inc. While working there he completed his BSEE degree from the University of Florida. He first started working in the Semiconductor industry in 1993 after joining Motorola. He spent his first several years performing test program support, development and CIM tool development working in a Test Engineering department. During this period Paul developed several mixed-signal programs utilizing dual site and sequencer capabilities. Paul then transferred to the Somerset Design Center where he worked on PowerPC verification and CAD tool development projects. Paul received a Masters of Science degree in Software Engineering from the University of Texas in 1998. Paul's skills include object oriented design/programming in multiple languages, formal project management experience, specialized programming language development, distributed application development, expert system programming and database interfacing.
Bob Scott - VP Mixed Signal Test
Bob received his BSEE degree from the University of Texas at Austin. He joined Motorola Inc. in 1984 after a year with NEC America performing field installation, test and alignment of microwave radio equipment. For 12 years he served as an ATE Software Specialist supporting Telecom Product Engineering for Motorola providing UNIX and SUN-OS support and performing system administration duties. He was responsible for development, maintenance, and installation of test programs, hardware, and interfaces for both wafer test and package test. He participated in all phases of Production Test and Wafer Probe Processes including: test plan preparation, wafer probe and package test integration, yield analysis, program maintenance and optimization, data collection, system utilization, and ongoing product engineering. He trained test engineers to support Teradyne A5 test platforms and existing applications. He spent over 2 years with a tester manufacturer developing turn-key test solutions and associated test software tools. These applications included single and multi-site solutions for probe and package test of digital and mixed-signal devices. He provided training for test engineers and maintenance technicians.
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is a versatile, low-cost test development tool
for converting vectors to targeted ATE tester formats,
including pattern....
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is a low-cost, user friendly test development tool used for Generating Cyclized ATE Test Vectors in either WGL or STIL formats. This highly versatile tool reads in both VCD and EVCD....
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